Scanning electron microscope JEOL JSM-IT510LA with cryo preparation system Quorum PP3010T – Institute of Plastics and Circular Economy

Analytical scanning electron microscope JEOL JSM-IT510LA with cryo preparation system Quorum PP3010T

© Bittner | IKK
© Bittner | IKK
© Bittner | IKK

Manufacturer: JEOL Ltd. / Quorum Technologies Ltd.

Short description: Analytical scanning electron microscope (SEM) for high-resolution imaging of sample surfaces. Energy dispersive X-ray spectroscopy (EDS) can be used to detect and quantify chemical elements in samples and determine their spatial distribution. A low vacuum mode allows imaging of poorly conductive samples without coating. The cryo preparation system allows samples to be prepared at low temperatures, introduced into the SEM and examined.

Samples: Among others, thermoplastics, duromers, elastomers in the form of bulk material, films, fabrics, particles, foams

Extensive equipment is available for sample preparation.

Technical data SEM
Emitter	Thermal: LaB₆ (changeable to W)
Acceleration voltage	0.3 to 30 kV
Resolution (LaB₆)	≤ 2 nm @ 30 kV ≤ 12.5 nm @ 1 kV
Specimens	Diameter max. 200 mm Weight max. 5 kg
Low vacuum mode	10 to 650 Pa
Imaging detectors	Secondary electron detector Backscattered electron detector Low vacuum secondary electron detector
Energy-dispersive X-ray spectrometer (EDS)	JEOL EDS system 60 mm² active detector area Energy resolution: ≤ 133 eV (MnKα) Element range: B to U

Technical data cryo preparation system
Cooling SEM cold stage	down to -190 °C, temperature stability < 0.5 °C
Cold trap	down to -190 °C
Hold times	max. 24 h
Cryo sample preparation	Fracturing tool Sublimation mode Integrated sputter coater with platinum target

The cryo scanning electron microscope is operated jointly with the Institute for Multiphase Processes IMP.

Funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) – 467965905.

The conditions of use are outlined in the Nutzungsordnung des Labors für Kryo-Rasterelektronenmikroskopie.