Analytical scanning electron microscope JEOL JSM-IT510LA with cryo preparation system Quorum PP3010T

  • © Bittner | IKK

  • © Bittner | IKK

  • © Bittner | IKK

Manufacturer: JEOL Ltd. / Quorum Technologies Ltd.

Short description: Analytical scanning electron microscope (SEM) for high-resolution imaging of sample surfaces. Energy dispersive X-ray spectroscopy (EDS) can be used to detect and quantify chemical elements in samples and determine their spatial distribution. A low vacuum mode allows imaging of poorly conductive samples without coating. The cryo preparation system allows samples to be prepared at low temperatures, introduced into the SEM and examined.

Samples: Among others, thermoplastics, duromers, elastomers in the form of bulk material, films, fabrics, particles, foams

Extensive equipment is available for sample preparation.

Technical data SEM
Emitter Thermal: LaB6 (changeable to W)
Acceleration voltage 0.3 to 30 kV
Resolution (LaB6)
  • ≤ 2 nm @ 30 kV
  • ≤ 12.5 nm @ 1 kV
  • Diameter max. 200 mm
  • Weight max. 5 kg
Low vacuum mode 10 to 650 Pa
Imaging detectors
  • Secondary electron detector
  • Backscattered electron detector
  • Low vacuum secondary electron detector
Energy-dispersive X-ray spectrometer (EDS)
  • JEOL EDS system
  • 60 mm2 active detector area
  • Energy resolution: ≤ 133 eV (MnKα)
  • Element range: B to U
Technical data cryo preparation system
Cooling SEM cold stage down to -190 °C, temperature stability < 0.5 °C
Cold trap down to -190 °C
Hold times max. 24 h
Cryo sample preparation
  • Fracturing tool
  • Sublimation mode
  • Integrated sputter coater with platinum target

The cryo scanning electron microscope is operated jointly with the Institute for Multiphase Processes IMP.

Funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) – 467965905.

Conditions of use

The conditions of use are outlined in the Nutzungsordnung des Labors für Kryo-Rasterelektronenmikroskopie.